| LC control no. | n 87949198 |
|---|---|
| Descriptive conventions | rda |
| Personal name heading | Weber, Eicke R. |
| Variant(s) | Weber, E. R. (Eicke R.) |
| Found in | Int. Symp. on Defect Recognition and Image Processing in III-V Compounds (2nd : 1987 : Monterey, Calif.). Defect recog. and ... 1987: CIP t.p. (E. R. Weber, Dept. of Materials Sci. and Mineral Eng., Univ. of Calif., Berkeley, Calif.) pref. (Eicke R. Weber) book t.p. (Eicke R. Weber) Predictive simulation of semiconductor processing, c2004: CIP t.p. (E.R. Weber) data sheet (Weber, Eicke R.; b. Oct. 28, 1949) |
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