| LC control no. | sh 94008704 |
|---|---|
| LC classification | QH212.A78 |
| Topical heading | Atomic force microscopy |
| Variant(s) | AFM (Microscopy) |
| See also | Scanning probe microscopy |
| Found in | Work cat.: 94-42035: Selected papers on scanning probe microscopes, c1995: CIP galley (Atomic force microscopy; AFM) ASTI, v. 1993 (Atomic force microscopy) Encyc. phys. sci tech.: v. 10, p. 415 (advent of the scanning tunneling microscope and the atomic force microscope, which allow imaging of single atoms and molecules, is providing renewed excitement in the field of molecular electronics) INSPEC (Atomic force microscopy) MESH (Microscopy, Atomic force) |
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