| LC control no. | sh2005007340 |
|---|---|
| Topical heading | Auger electron spectroscopy |
| Variant(s) | AES (Spectrum analysis) Auger microscopy, Scanning Microscopy, Scanning auger SAM (Spectrum analysis) Scanning auger microscopy |
| See also | Electron spectroscopy |
| Found in | Work cat.: Ferrante, J. Auger electron spectroscopy and depth profile study of oxidation of modified 440C steel, 1974: pp. 1-2 (AES (Auger electron spectroscopy) ... is a technique for examining the elemental composition and, in some cases, the compound compositions of surfaces to a depth of 4 or 5 atomic layers) Handbook of analytical methods for materials, via WWW, Nov. 3, 2005: (Auger electron spectroscopy (AES), also known as scanning Auger microscopy (SAM), is a surface analytical technique that provides information about the chemical composition of surfaces and interfaces. AES uses an incident electron beam to excite a solid resulting in the emission of electrons known as Auger electrons. An energy analysis of these Auger electrons provides the analytical information for this technique) Encyclopedia of physical science and technology, 2002: v. 1, p. 787 (Auger electron spectroscopy is an electron spectroscopy that employs Auger, or secondary, electrons to determine the chemical composition of a solid surface. Because the electrons that are detected are of very low energy, this spectroscopy probes only the top two to five atom layers of the surface) McGraw-Hill dictionary of scientific and technical terms, 2003: (Auger electron spectroscopy -- The energy analysis of Auger electrons produced when an excited atom relaxes by a radiationless process after ionization by a high-energy electron, ion, or x-ray beam. Abbreviated AES) |
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