| LC control no. | sh 88001890 |
|---|---|
| LC classification | QD96.X2 |
| Topical heading | Proton-induced X-ray emission |
| Variant(s) | PIXE (Spectrum analysis) X-ray emission, Proton-induced |
| See also | X-ray spectroscopy |
| Found in | Work cat.: Johansson, S.A.E. Proton-induced X-ray emission, 1988: CIP galley (proton-induced X-ray emission (PIXE); an analytical method based on X-ray spectrometry) McGraw-Hill dict. sci. tech. (proton-induced X-ray emission: method of elemental analysis in which the energy of the characteristic x-rays emitted when a sample is bombarded with a beam of energetic protons is used to identify the elements present in the sample) LC data base, 3/28/88 (proton-induced X-ray emisssion) INSPEC (proton induced X-ray emission, USE Ion microprobe analysis, X-ray chemical analysis) |
| Not found in | Chem. abst.; Compend. analyt. nomenclature; INIS; NASA; Web. 3 |
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